IODP Expedition 378 X-ray fluorescence (XRF)

Elemental peak intensities in section halves were measured by an Avaatech X-ray fluorescence (XRF) Core Scanner postexpedition. Each measurement position may be measured at multiple XRF conditions in order to excite and measure specific ranges of elements (e.g., 10 kV and no filter for light elements). Peak intensity changes (concentrations not provided) are then used to help recognize and define major chemostratigraphic units without the need for destructive sampling. Data are presented in comma-delimited (CSV) files by section and by energy/instrumental conditions.

经航次后阶段，使用Avaatech型X射线荧光（X-ray fluorescence, XRF）岩心扫描仪对岩心半段的元素峰强度进行了测量。为激发并测定特定范围的元素（例如针对轻元素采用10 kV电压且无滤光片的测试参数），每个测量点位可在多种XRF测试条件下进行测量。随后借助峰强度变化（未提供元素浓度数据）即可识别并划分主要的化学地层单元，且无需开展破坏性取样。数据集按岩心段以及测试能量/仪器参数整理为逗号分隔值（comma-delimited, CSV）格式文件。