Simulated shielding performance of 1728 three-layer permutations of 12 common satellite and radiation shielding materials against trapped particles on GTO

The 3Layer.csv file contains ionizing dose results of simulating the shielding performance of all 1728 three-layer permutations of twelve common satellite and radiation shielding materials against trapped particles on GTO.<br> The materials are pure aluminium (G4_Al), the aluminium alloy 7075 (Al_7075), polyethylene (G4_POLYETHYLENE), kevlar (G4_KEVLAR), lead (G4_Pb), tungsten (G4_W), stainless steel (G4_STAINLESS_STEEL), pure carbon fibre (CarbonFibre), the circuit board composite material FR4 (FR4), tantalum (G4_Ta), Teflon (G4_TEFLON) and the titanium alloy 6Al-4V (Ti_6AL_4V).<br> The particle spectra used for this simulation are provided in the files AE9500keV.mac and AP910MeV.mac.<br> The simulated geometry is provided in the file 3Layer.gdml. The particle spectra were generated with the AE9/AP9 models on SPENVIS, with electron energies starting at 500 keV and proton energies starting at 10 MeV.<br> The simulation was performed with GRAS / Geant4 with the FTFP_BERT physics model using 3.9e+10 electrons and 4.7e+09 protons directed against slabs of shielding materials of 1.5 g/cm2 total depth with each of the three layers being 0.5 g/cm2 in depth.<br> The ionizing dose is recorded in 0.5mm thick silicon plates behind the shielding plates.<br> <br> Column A: ID of the material combination<br> Column B: Name of the top layer material.<br> Column C: Name of the middle layer material.<br> Column D: Name of the bottom layer material.<br> Column E: Ionizing dose due to electrons in units of kRad per month.<br> Column F: Absolute statistical error in the electron dose in kRad per month.<br> Column G: ionizing dose due to protons in kRad per month.<br> Column H: Absolute statistical error in the proton dose in kRad per month. <br> Column I: Total ionizing dose from electrons and protons in kRad per month.<br> Column J: Absolute statistical error in the total ionizing dose in kRad per month. <br> Column K: Relative statistical error of the total ionizing dose in per cent.<br> Column L: Rank of the material combination sorted from lowest total ionizing dose to highest.<br> Column M: Rank of the material combination sorted from lowest electron dose to highest.<br> Column N: Rank of the material combination sorted from lowest proton dose to highest. All dose values are rounded according to their uncertainty.3Layer.csv 文件包含了针对地球同步转移轨道（GTO）上的俘获粒子（trapped particles），模拟12种常见卫星及辐射屏蔽材料对其的屏蔽性能所得的全部1728种三层排列组合的电离剂量（ionizing dose）结果。 本次模拟所用的材料包括：纯铝（G4_Al）、7075铝合金（Al_7075）、聚乙烯（G4_POLYETHYLENE）、凯夫拉（G4_KEVLAR）、铅（G4_Pb）、钨（G4_W）、不锈钢（G4_STAINLESS_STEEL）、纯碳纤维（CarbonFibre）、电路板复合材料FR4（FR4）、钽（G4_Ta）、特氟龙（G4_TEFLON）以及钛合金6Al-4V（Ti_6AL_4V）。 本次模拟所用的粒子能谱（particle spectra）已在AE9500keV.mac和AP910MeV.mac文件中提供。 模拟所用的几何模型已在3Layer.gdml文件中给出。粒子能谱通过SPENVIS平台上的AE9/AP9模型生成，其中电子能谱的能量起始值为500 keV，质子能谱的能量起始值为10 MeV。 本次模拟采用GRAS/Geant4工具包，结合FTFP_BERT物理模型完成，共使用3.9×10^10个电子与4.7×10^9个质子入射至总厚度为1.5 g/cm²的屏蔽材料板中，且三层材料各自的厚度均为0.5 g/cm²。 电离剂量的测量位置为屏蔽板后方的0.5 mm厚硅片。 A列：材料组合的唯一标识 B列：顶层材料名称 C列：中层材料名称 D列：底层材料名称 E列：电子引发的电离剂量，单位为千拉德（kRad）/月 F列：电子剂量的绝对统计误差（absolute statistical error），单位为千拉德（kRad）/月 G列：质子引发的电离剂量，单位为千拉德（kRad）/月 H列：质子剂量的绝对统计误差（absolute statistical error），单位为千拉德（kRad）/月 I列：电子与质子共同引发的总电离剂量，单位为千拉德（kRad）/月 J列：总电离剂量的绝对统计误差（absolute statistical error），单位为千拉德（kRad）/月 K列：总电离剂量的相对统计误差（relative statistical error），单位为百分比 L列：按总电离剂量从低到高排序的材料组合排名 M列：按电子剂量从低到高排序的材料组合排名 N列：按质子剂量从低到高排序的材料组合排名 所有剂量值均根据其不确定度进行了修约。