complex optical constants as functions of wavelengths, of the thin film of S1 (TPPO +Cz) and S4 (DPPO+TPA) deposited on silicon, by spectroscopic ellipsometry.

We obtained complex optical constants, viz. refractive indices and extinction coefficients as a function of wavelengths, of the thin film of S1 (TPPO +Cz) and S4 (DPPO+TPA) deposited on silicon, by spectroscopic ellipsometry. These values are useful in obtaining steady-state and transient-state behavior for OLED devices in the OLED simulation suite SETFOS.<br>

本研究采用光谱椭偏测量术（spectroscopic ellipsometry），测得沉积于硅衬底上的S1（TPPO + Cz）与S4（DPPO + TPA）薄膜的复光学常数，即随波长变化的折射率与消光系数。
该数据集可用于在有机发光二极管（OLED）模拟套件SETFOS中，开展OLED器件的稳态与瞬态特性研究。