Physico-chemical characterization of sterile citrated stabilized Au nanoparticles by XPS / HAXPES / SEM

Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.

Sterile citrated stabilized Au nanoparticles with a diameter of approx. 30 nm were synthesized under aseptic conditions at Mintek, South Africa (EMR-Identifier in the project: ERM00000582).

Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers.  First SEM measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.

Equipment:

SEM images were acquired with a Supra 40 (Zeiss) SEM.

For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (Quantes from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.

Data:

For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.

Naming of data:

SEM: sample_treatment (n), with n a consecutive number.

XPS / HAXPES:    For the .spe and for the corresponding .npl files Pn.m.o.sample_treatment, with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "p" for pristine.

The authors thank Thorid Lange, who performed the SEM measurements.

本数据集包含用于纳米颗粒理化表征的X射线光电子能谱（X-ray Photoelectron Spectroscopy, XPS）、硬X射线光电子能谱（Hard X-ray Photoelectron Spectroscopy, HAXPES）以及扫描电子显微镜（Scanning Electron Microscopy, SEM）测量数据。该测量工作隶属于欧盟地平线2020（Horizon 2020）项目“NanoSolveIT”。

本次实验所用的直径约30 nm、经柠檬酸盐稳定的无菌金纳米颗粒，于南非明泰克（Mintek）公司的无菌条件下合成（项目内EMR标识符：ERM00000582）。

测量前，将纳米颗粒溶液滴涂于硅片上制备样品。首先对同一样品依次开展SEM测量，随后开展XPS与HAXPES测量。测量流程为先采集全谱，再采集高分辨谱。XPS与HAXPES测量时，将多张硅片共同安装于一个样品台之上，样品台在测量开始前需置于仪器的引入腔中静置数小时。

实验设备：
SEM成像采用蔡司（Zeiss）Supra 40型扫描电子显微镜完成。
X射线光谱实验采用组合式XPS/HAXPES光谱仪（ULVAC-PHI公司Quantes型号），其中XPS测量使用1486.6 eV的单色铝Kα射线源，HAXPES测量使用5414.9 eV的单色铬Kα射线源。该设备支持在样品的完全相同位置开展两类测量。

数据格式：
SEM数据以.tif格式存储。XPS/HAXPES原始数据以.spe（PHI格式）与.npl（VAMAS格式）文件存储，测量条件已包含在数据文件中。

数据命名规则：
SEM数据命名格式为：sample_treatment (n)，其中n为连续编号。
XPS/HAXPES数据：.spe及对应的.npl文件命名格式为Pn.m.o.sample_treatment，其中Pn为样品台编号，m为测量谱序号（测量顺序），o为样品上的点位编号，sample_treatment中用“p”表示原始未处理样品。

作者感谢托里德·兰格（Thorid Lange）完成了本次SEM测量工作。