高速光电探测器降低暗电流后的暗电流及热噪声数据

面向高灵敏度探测系统的低噪声优化需求，是暗电流和热噪声是探测器噪声的主要来源，热噪声源于导体或半导体中电子的无规则热运动，表现为瞬时电流扰动，其功率谱密度在所有频段均匀分布，因此也称约翰逊噪声或白噪声，暗电流和热噪声降低后可提升系统信噪比。基于在无光条件下测试常温和液氮温度下的IV曲线得到两种不同条件下的暗电流，并通过计算得到热噪声数据，通过工艺优化（改善钝化层工艺、改善热退火工艺控制）降低暗电流后，测试改善工艺前后的暗电流大小及热噪声谱密度产生方法。主要记录不同阶段、不同温度（300K和77K）下的暗电流数值、热噪声等数据。意义在于为低噪声混频器设计、系统信噪比分析提供基础，保障探测灵敏度。For the low-noise optimization requirements of high-sensitivity detection systems, dark current and thermal noise are the main sources of detector noise. Thermal noise originates from the random thermal motion of electrons in conductors or semiconductors, manifesting as transient current disturbances. Its power spectral density is uniformly distributed across all frequency bands, hence it is also called Johnson noise or white noise. Reducing dark current and thermal noise can improve the system signal-to-noise ratio (SNR). Dark currents under two different conditions (room temperature and liquid nitrogen temperature) were obtained by testing IV curves in the absence of light, and thermal noise data were derived through calculations. After reducing dark current via process optimization (improving passivation layer process and thermal annealing process control), the dark current magnitudes and thermal noise spectral densities before and after the process improvement were tested. The dataset mainly records dark current values, thermal noise, and other data under different stages and temperatures (300K and 77K). Its significance lies in providing a basis for low-noise mixer design and system SNR analysis, ensuring detection sensitivity.

搜集汇总

背景与挑战

背景概述

该数据集聚焦于高速光电探测器的低噪声优化，通过工艺优化降低暗电流后，记录了常温和液氮温度（300K和77K）下的暗电流数值和热噪声数据。数据旨在支持低噪声混频器设计和系统信噪比分析，以提升探测灵敏度，属于国家重点研发计划项目的一部分，包含多种文件格式（如txt、xls、pdf）的实验数据。