Elimination of Charge-Carrier Trapping by Molecular Design

Force fields used for DOS calculations NMR and XRD data of organic crystals and films I-V, cyclic voltammetry, photoluminescence, UPS and UV-vis data of organic compounds

本数据集涵盖用于有机晶体与薄膜的态密度（DOS, Density of States）计算、核磁共振（NMR, Nuclear Magnetic Resonance）与X射线衍射（XRD, X-ray Diffraction）数据相关分析的力场，以及有机化合物的电流-电压（I-V, Current-Voltage）、循环伏安法、光致发光、紫外光电子能谱（UPS, Ultraviolet Photoelectron Spectroscopy）与紫外-可见（UV-vis, Ultraviolet-Visible）光谱数据。