Statistical efficiencies of the designs.

InvC = inventory code; Var = Variable; Y = Year; n = number of plots; M = mean; Pc(%) = computed power for independent and dependent samples and for the hypothesized mean; Pset = set power; Required n at given power (Pset) and % of mean change = required sample size at 2%, 5%, 10%, 15% …change in mean; InvPair = inventory pair; 2M IDP = two mean test for independent samples; 2M DEP = two mean test for dependent samples; 1M = one mean test (of hypothesized mean);
* = actual sample size successfully detects the differences in mean change. See also abbreviations in Table 1.

InvC = 库存编码（inventory code）；Var = 变量（Variable）；Y = 年份（Year）；n = 样地数量（number of plots）；M = 均值（mean）；Pc(%) = 独立样本、相依样本与假设均值的计算检验功效（computed power for independent and dependent samples and for the hypothesized mean）；Pset = 设定检验功效（set power）；Required n at given power (Pset) and % of mean change = 给定设定检验功效（Pset）与均值变化百分比时所需的样本量，即均值变化为2%、5%、10%、15%……时所需的样本量；InvPair = 库存配对（inventory pair）；2M IDP = 独立样本两均值检验（two mean test for independent samples）；2M DEP = 相依样本两均值检验（two mean test for dependent samples）；1M = 单均值检验（one mean test of hypothesized mean）；
* 代表实际样本量可成功检出均值变化的差异。详见表1中的缩写说明。