Comparison of mass specra obtained with and Atom Probe installed in a TEM (JEOL F 200, designated as SATMET) at Groupe de Physique des Matériaux UMR 6634 (Saint Etienne du Rouvray, France) and in a LEAP 5000 XS

Comparison of mass specra obtained with an Atom Probe installed in a TEM (JEOL F 200, designated as SATMET) at Groupe de Physique des Matériaux UMR 6634 (Saint Etienne du Rouvray, France) and in a LEAP 5000 XS 

Conditions of analyses

Material: Fe-51.4Cr (at%) alloy

Temperature of APT analyses: 78KPulse repetition rate in LEAP 5000 XS: 25 kHzPulse repetition rate in SATMET: 20 kHzNumber of events collected in LEAP 5000 XS: 807 784Number of events collected in SATMET: 472 423

本数据集为分别采用安装于透射电子显微镜（Transmission Electron Microscope, TEM）内的原子探针（Atom Probe，型号为JEOL F 200，命名为SATMET）与LEAP 5000 XS设备，在法国圣艾蒂安迪鲁夫赖的材料物理研究组UMR 6634中获取的质谱的对比研究。
分析条件
材料：原子百分比为51.4%的铁铬（Fe-51.4Cr）合金
原子探针断层扫描（Atom Probe Tomography, APT）分析温度：78K
LEAP 5000 XS的脉冲重复频率：25 kHz
SATMET的脉冲重复频率：20 kHz
LEAP 5000 XS采集到的事件数：807784
SATMET采集到的事件数：472423