In situ measurement of the specific surface area of reduced graphene oxide using time-resolved laser induced incandescence

The data is recorded from a laser-induced incandescent measurement of reduced graphene oxide reduced at different reduction temperatures using a tube furnace. Intensity data of incandescent traces recorded by four separate PMTs at wavelengths of 447 nm, 545 nm, 645 nm, and 747 nm. The data is processed into five different files, named based on the reduction temperature of the tube furnace. Each column represents a different wavelength range, as follows: 1: 447 nm, 2: 747 nm, 3: 545 nm, 4: 645 nm. The data is relatively calibrated and shortened to reflect the temperature data from the peak of the signal. Additionally, time data is appended, which directly correlates to the time of the incandescent signal.

本数据集采集自管式炉制备的、经不同还原温度处理的还原氧化石墨烯的激光诱导炽光测量实验。数据集包含4台独立光电倍增管（Photomultiplier Tube，PMT）在447 nm、545 nm、645 nm及747 nm四个波长下采集的炽光信号强度数据。经处理后的数据被整理为5个不同文件，文件名基于管式炉的还原温度命名。数据文件中每一列对应一个特定波长范围，对应关系如下：第1列为447 nm，第2列为747 nm，第3列为545 nm，第4列为645 nm。本数据集已完成相对校准与精简，以反映信号峰值对应的温度信息。此外，数据中还附加了与炽光信号时刻直接相关的时间序列数据。