Corrugated Epsilon-Near-Zero Saturable Absorber for High-performance 1.3 μm Solid-state Bluk Laser

Structure and characterization of CITO film (SEM/XRD). Static optical properties of ITO and CITO films.  Z-scan results of CITO and ITO films at 1340 nm. Passively Q-switched laser characteristics of CITO-based SA at 1.34 μm.

CITO薄膜的结构与表征（扫描电子显微镜（Scanning Electron Microscope, SEM）/X射线衍射（X-ray Diffraction, XRD））。氧化铟锡（Indium Tin Oxide, ITO）与CITO薄膜的静态光学特性。1340 nm波长下CITO与ITO薄膜的Z扫描（Z-scan）测试结果。基于CITO的可饱和吸收体（Saturable Absorber, SA）在1.34 μm波长下的被动调Q激光特性。