Video recording associated with the publication: The long-term reliability of pre-charged CMUTs for the powering of deep implanted devices

This dataset contains the video recordings associated with the publication. In the video, one CMUT element is exernally biased with a DC bias source, which is swept between 0 and 130 V and vice-versa. It can be seen that CMUTs go into collapse when the external DC bias voltage is higher than the collapse voltage (multiple rings of interference pattern appears at CMUTs cells, indicating a larger deflection profile). It can also be seen that not all the CMUT cells go into collapse and out-of-collapse at the same time.

本数据集包含与该学术出版物相关的视频录像。视频中，1个电容式微机械超声换能器（Capacitive Micromachined Ultrasonic Transducer，CMUT）单元通过直流偏置源施加外部偏置，该偏置电压在0至130伏特范围内扫描并反向往复扫描。可观察到，当外部直流偏置电压高于塌陷电压时，CMUT会进入塌陷状态，此时其单元表面会出现多圈干涉图样，表明偏转轮廓更大。同时还可观察到，并非所有CMUT单元会同时进入和退出塌陷状态。