High Piezoelectric Property with Exceptional Stability in Self-Poled Ferroelectric Films

The experimental measurements that generate raw profiles in this study, such as the dielectric and ferroelectric property characterization, X-ray Photoelectron Spectroscopy, Raman, and X-ray diffraction characterizations. The name of the file obeys the rule of discriminating the sample type or the measurement type.

本研究中用于生成原始测试谱图的实验表征方法涵盖介电与铁电性能表征、X射线光电子能谱（X-ray Photoelectron Spectroscopy）、拉曼（Raman）测试以及X射线衍射（X-ray diffraction）表征。所有文件的命名均遵循区分样品类型或测试类型的规则。