Raw 4D-STEM nanobeam diffraction datasets for {111}c planar-defect quantification in MA₁₋ₓGuaₓPbI₃ perovskites
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Low-dose four-dimensional scanning transmission electron microscopy nanobeam diffraction (4D-STEM NBD) datasets for MA₁₋ₓGuaₓPbI₃ perovskite thin films, used for grain-by-grain quantification of {111}c planar defects. The repository contains eight raw datasets (.h5): four regions of interest (ROIs) each for the Gua20 (MA₀.₈Gua₀.₂PbI₃) and Gua25 (MA₀.₇₅Gua₀.₂₅PbI₃) compositions. The grain-segmentation and {111}c defect-classification code used to process these datasets is available at https://github.com/ByeongjunGil/GrainSTEM. These data accompany the manuscript "Design Rules for Quantitative Control of Intragrain Planar Defects in Halide Perovskites", by B. Gil et al. (citation to be updated upon publication).
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Zenodo创建时间：
2026-06-30
