UEM data supporting "Imaging Nanometer Phonon Softening at Crystal Surface Steps with 4D Ultrafast Electron Microscopy"

This dataset includes 4D ultrafast electron microscopy (UEM) bright-field imaging data supporting the paper "Imaging Nanometer Phonon Softening at Crystal Surface Steps with 4D Ultrafast Electron Microscopy".本数据集包含4D超快速电子显微镜（UEM，4D Ultrafast Electron Microscopy）明场成像数据，用于支撑论文《利用4D超快速电子显微镜对晶体表面台阶处的纳米级声子软化进行成像》。