SSX structure of Autotaxin in cryogenic conditions

Measurements from rATX microcrystals were carried out under cryogenic conditions (100 K) with a 4 × 4 μm2 microfocus beam at 14.2 keV (wavelength at 0.8731 Å) on ID23-2. Loops containing microcrystals harvested as whole crystallisation drops and rapidly raster scanned with X-ray exposure time of 6 ms to identify positions corresponding to well diffracting crystals. In a second step, 10° wedges were collected with a 20 ms exposure time from each of the identified positions at a speed of 5°/sec using the MeshAndCollect automated multi-crystal data collection workflow. If dose permitted, 2-3 sweeps of 10° wedges were collected from each identified crystal. Each 10° wedge takes typically 2 sec. Initial diffraction patterns were processed using XDS, followed by real-time automated selection and merging of statistically equivalent datasets with XSCALE using the sxdm tool. The structure were solved by molecular replacement using PHASER and refinement was carried out iteratively with phenix.refine. The refined model has been deposited with the PDB ID: 9ENT