Rough surface - Sample ID P55

An XE-100 atomic force microscope (AFM, Park Systems) was used in contact mode with a NSC36C cantilever (Park Systems). The cantilever had a force constant of 0.6 N/m, resonant frequency of 65 kHz, length of 130 ± 5 μm, width of 32.5 ± 3 μm, and thickness of 1.0 ± 0.5 μm. Images were acquired at scan sizes of 2 μm, 3 μm, 4 μm, 5 μm, 10 μm, and 30 μm at a scan rate of 1 Hz.

本研究采用Park Systems公司生产的XE-100型原子力显微镜（atomic force microscope, AFM），以接触模式开展测试，并搭配Park Systems公司的NSC36C型悬臂梁。该悬臂梁的力常数为0.6 N/m，共振频率为65 kHz，长度为130 ± 5 μm，宽度为32.5 ± 3 μm，厚度为1.0 ± 0.5 μm。图像采集时设置的扫描尺寸分别为2 μm、3 μm、4 μm、5 μm、10 μm及30 μm，扫描速率为1 Hz。