Mapping the Rare Earth Magnetization profile in designed compositionally-graded GdCoFe ferrimagnetic alloy films for spintronic applications.

This experiment aims to map the local variations of Gd magnetization profile through the thickness of GdFeCo ferrimagnetic films with a deliberately designed Gd variation through the film thickness. Hard X-ray resonant dichroism and magnetic reflectivity (XRMR) at the Gd L3 edge (7.24 keV) will be used to map the Gd magnetization profile through the film thickness. Temperature dependent XRMR measurements through compensation, combined with SIMS and SQUID magnetometry, will enable us to understand the evolution of the global and local compensation behaviour. This approach offers a comprehensive understanding of magnetization behaviour arising from compositional non-uniformities and their influence on the evolution of ferrimagnetic compensation in RE:TM alloys for spintronics.

本实验旨在通过精准调控钆（Gd）在膜厚方向的组分分布，测绘钆铁钴（GdFeCo）亚铁磁薄膜膜厚方向的局部磁化剖面。实验将采用钆L3吸收边（7.24 keV）处的硬X射线共振磁二向色性与磁反射（XRMR）技术，完成该薄膜厚度方向的钆磁化剖面测绘。结合补偿点附近的温度依赖XRMR测量、二次离子质谱（Secondary Ion Mass Spectrometry, SIMS）与超导量子干涉仪（Superconducting Quantum Interference Device, SQUID）磁强计表征，本研究可阐明全局与局部补偿行为的演化规律。该方法可全面揭示组分非均匀性引发的磁化行为，并明晰其对自旋电子学领域稀土-过渡金属（RE:TM）合金中亚铁磁补偿演化的影响。