XPS measurements on long-term stability of organic radical thin films
收藏NIAID Data Ecosystem2026-05-01 收录
下载链接：
https://zenodo.org/record/10854586
下载链接
链接失效反馈官方服务：
资源简介：
XPS raw data underlying Figures 1, 2, and 3 from the publication "Long-Term Degradation Mechanisms in Application-Implemented Radical Thin Films" (DOI: 10.1021/acsami.3c02057).
创建时间：
2024-04-23
