Data of Hyperspectral Optical Microscopy for Characterization of 2D Semiconductors and Heterostructures
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The raw data (.tif) of the paper: Hyperspectral Optical Microscopy for Characterization of 2D Semiconductors and Heterostructures. Paper Link: https://iopscience.iop.org/article/10.1088/2053-1583/ae33d0
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Zenodo创建时间：
2026-02-20
