Determination of thermal reversible and irreversible effects during crystal irradiation at 4th generation synchrotrons

We want to determine, by means of single crystal X-ray nanodiffraction, the relative amount of reversible and irreversible changes taking place in the crystal lattice of a few different materials as a consequence of X-ray irradiation. The importance of lattice heating will be addressed and compared to numerical models, gaining knowledge about the lattice temperature evolution, lattice damage and on the possible routes for defect engineering.

本研究拟借助单晶X射线纳米衍射（single crystal X-ray nanodiffraction）技术，定量表征多种不同材料的晶格在X射线辐照下发生的可逆与不可逆变化的相对占比。本研究将阐明晶格热效应的重要性，并将实验结果与数值模型进行比对，以此获取关于晶格温度演化规律、晶格损伤机制以及缺陷工程可行路径的相关认知。