Mapping populations and dynamics of point defects

We can find metal oxides in numerous technological applications, from fuel cells to flash memory. Many of their physical functionalities are closely related to the point defects present in them. However, current methods used to characterize these type of defects are limited to sample surface or indirect measurements. In this proposal, we aim to directly map single standing defects in bulk complex oxides through the local strain fields they generate. This should be done at the DFXM at ID06 since it provides the strain sensitivity adapted to such fields. The combination of the experimental results with simulated 3D multiscale models will allow for quantitative estimation of defect density. This will provide the first of its kind measurement enabling direct visualization and quantification of point defect populations under real operating conditions.