EBSD dataset for the HRDIC strain localization study in shot peened Ni superalloy

We used Electron Backscattered Diffraction (EBSD) to characterize the microstructure in the transverse section of the shot-peened RR1000 Ni-based superalloy sample with a CamScan MX2000 equipped with an Oxford Instruments EBSD camera operating at an acceleration voltage of 20 kV and using a step size of 0.45 µm. The sample was ground to #4000 grit paper and finished with OP-S (0.2 µm) suspension for ~30 min. EBSD data was analysed using the commercial Channel 5 software (Oxford Instruments).

This EBSD map is coupled with the HRDIC strain map in http://doi.org/10.5281/zenodo.4728016 and data visualisation scripts in http://doi.org/10.5281/zenodo.4727939