Nanofiber SEM Dataset

This study presents a deep learning-based framework for automated defect detection in electrospun Polyacrylonitrile (PAN) nanofibers using Scanning Electron Microscope (SEM) images. The proposed Nanofiber Classifier model is trained on a dataset consisting of three categories: Slightly Defective, Defective, Non-Defective本研究提出了一种基于深度学习的框架，可利用扫描电子显微镜（Scanning Electron Microscope, SEM）图像实现静电纺丝聚丙烯腈（Polyacrylonitrile, PAN）纳米纤维的自动化缺陷检测。所提出的纳米纤维分类器模型在包含三个类别的数据集上进行训练，该数据集涵盖轻微缺陷、缺陷、无缺陷三个类别。