Surface Topography Challenge: smooth 2nd CrN sample

The file CRN-ST1.XYZ (sample-nr.: A44) was recorded using a holographic microscope from Lynceetec. The sample was the smooth CrN sample provided for the challenge. The microscpes' model is a custom-built model R2100 that is attached to a reciprocating Tribometer. The micrograph was acquired with a 20x lens (Leica N Plan EPI 20/0.4). The raw data was converted to an XYZ file using the Bruker Vision64 software (.sdf file) and from there to XYZ data using Gwyddion. We note that dust particles in the optical path of the microscope caused ring-like artifacts that affected the measurement.

The file CRN-ST-WLI.XYZ (sample-nr.: A44) was recorded with a White light interferometer (Bruker Contour GT) with a 50x lens to evaluate the effect of the dust particles in the DHM.

The table below shows the acquired data for the RMS slope (R∆q) and the RMS hight (Sq) when analyzing the data and applying tilt removal:
Sample RΔq [1] Sq [µm]
CRN-ST1.XYZ x 7.3573×10⁻³ 0,0054299
y 7.246×10⁻³
CRN-ST-WLI.XYZ x 8.795×10⁻³ 0,0097289
y 1.3687×10⁻²

Experiment was conducted by Stefan Kinzelberger

文件CRN-ST1.XYZ（样品编号：A44）由Lynceetec公司的全息显微镜采集获得。本次测试样品为挑战赛提供的光滑氮化铬（CrN）试样。该显微镜为定制型号R2100，搭载于往复式摩擦试验机上。显微图像通过20倍物镜（Leica N Plan EPI 20/0.4）采集得到。原始数据首先通过布鲁克（Bruker）Vision64软件（.sdf格式文件）转换为XYZ文件，随后再借助Gwyddion软件处理为XYZ格式数据。需注意，显微镜光路中的尘埃颗粒会产生环状伪影，对测量结果造成干扰。

文件CRN-ST-WLI.XYZ（样品编号：A44）采用白光干涉仪（Bruker Contour GT）搭配50倍物镜采集，用于评估数字全息显微镜（Digital Holographic Microscope, DHM）光路中尘埃颗粒的影响。

下表展示了在数据分析及倾斜校正后得到的均方根斜率（RMS slope, RΔq）与均方根高度（RMS height, Sq）数据：
| 样品 | 均方根斜率（RΔq）[1] | 均方根高度（Sq）[μm] |
|------|----------------------|----------------------|
| CRN-ST1.XYZ | x方向：7.3573×10⁻³
y方向：7.246×10⁻³ | 0.0054299 |
| CRN-ST-WLI.XYZ | x方向：8.795×10⁻³
y方向：1.3687×10⁻² | 0.0097289 |

本实验由Stefan Kinzelberger完成。