Measuring the full strain-field tensor around a dislocation
收藏DataCite Commons2025-09-07 更新2026-05-03 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-2229719867
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资源简介：
Dark-field X-ray microscopy (DFXM) enables three-dimensional, non-destructive mapping of lattice distortions with sub-micrometer resolution inside bulk crystalline materials. Here we propose the use of DFXM to measure the full strain-field tensor around an isolated dislocation. By combining angular- and spatial-resolved diffraction contrast imaging with multi-reflection analysis.
提供机构：
European Synchrotron Radiation Facility
创建时间：
2025-09-07
