Transient Current Technique (TCT) measurement data for a pcCVD diamond detector using an Am-241 alpha source

This dataset contains experimental Transient Current Technique (TCT) measurement data acquired from a pcCVD diamond detector using an Am-241 alpha source. The data consist of time-resolved current waveforms recorded under electron and hole transport configurations, for both pumped and unpumped detector states, at applied bias voltages from 150 V to 500 V in 50 V steps. The dataset is organized into condition-specific and voltage-specific subfolders, each containing the corresponding waveform data in CSV format. Its purpose is to support the analysis of charge-carrier transport, pulse-shape evolution, timing characteristics, and electric-field-dependent behavior in diamond detectors, and to provide the experimental basis for comparison with the associated simulation and modelling results reported in the related publication.