Training impact on electrical properties of P3 lumbar MNs. Rin: input resistance. Rheobase: lowest intensity of current injected in MNs to elicit an action potential (AP). AP threshold: voltage measured at the foot of the AP. AP amplitude: measured between the resting membrane potential and the AP peak. AP half width: time spent by the potential > 50% of the AP maximum amplitude. AP rise time: time spent by the potential between 10% and 90% of the AP maximum amplitude. AP half decay time: time spent by the potential between the AP maximum amplitude and the 50% decreasing amplitude. ADP: after-depolarization potential. All values are means ± SEM. The number of MNs recorded is indicated between brackets. ns: no significantly different. P-values are obtained from Mann-Whitney test or T-test statistical analysis, depending of the normal distribution of data sets. Underlying data can be found in the S1 Data Sheet.

Training impact on electrical properties of P3 lumbar MNs. Rin: input resistance. Rheobase: lowest intensity of current injected in MNs to elicit an action potential (AP). AP threshold: voltage measured at the foot of the AP. AP amplitude: measured between the resting membrane potential and the AP peak. AP half width: time spent by the potential > 50% of the AP maximum amplitude. AP rise time: time spent by the potential between 10% and 90% of the AP maximum amplitude. AP half decay time: time spent by the potential between the AP maximum amplitude and the 50% decreasing amplitude. ADP: after-depolarization potential. All values are means ± SEM. The number of MNs recorded is indicated between brackets. ns: no significantly different. P-values are obtained from Mann-Whitney test or T-test statistical analysis, depending of the normal distribution of data sets. Underlying data can be found in the S1 Data Sheet.