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X-Ray Fluorescence and Reflectography Data from Hamburg, Staats- und Universitätsbibliothek Hamburg Carl von Ossietzky, P. demot. 3

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DataCite Commons2025-01-14 更新2025-04-16 收录
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https://www.fdr.uni-hamburg.de/record/14836
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资源简介:
XRF (Bruker M6 JetStream: 50kV, 600 µA, maps with 70 to 200 µm steps and 40-50 ms per pixel) and  reflectography (DinoLite AD4113T-I2V: x40 magnification, vis, NIR ~940 nm and UV ~395 nm light) analysis of inks from P. demot. 3 from the Staats- und Universitätsbibliothek Hamburg Carl von Ossietzky. P. demot. 3 (P. Hawara 23, Tm 41479, SB 24 16163) is a papyrus with a contract in Demotic and a registration note in Greek. It also features traces of red stamps on the verso. It come from the Arsinoites nome (Fayum) and is dated to 67 BCE. The inks are carbon-based. Only minor traces of iron were found in the demotic part, visible in the map of the demotic detail. The stamps could not be directly analysed for conservation reasons, but are visible from XRF maps made on the recto. They appear to contain iron, with traces of potassium and sulphur. They are probably made of iron ochre. PDem3_Reflectography.zip - complete reflectography dataset PDem3_XRF.zip - complete XRF dataset PDem3_XRF_Protocol.pptx - XRF protocol PDem3r_Reflectography_Protocol - Reflectography protocol of the recto PDem3v_Reflectography_Protocol - Reflectography protocol of the verso

对汉堡卡尔·冯·奥西茨基州立与大学图书馆所藏P. demot. 3号纸莎草纸的墨迹开展了X射线荧光光谱(XRF)与反射成像法(Reflectography)分析:其中XRF测试使用Bruker M6 JetStream设备,参数为50kV工作电压、600µA工作电流,成像步长70至200 µm,单像素采集时长40-50 ms;反射成像测试使用DinoLite AD4113T-I2V设备,放大倍数为40倍,采用可见光、近红外(~940 nm)与紫外(~395 nm)光源。 P. demot. 3(编号对应P. Hawara 23、Tm 41479、SB 24 16163)是一份同时收录德摩提克语契约与希腊语登记注释的纸莎草纸,其背面留有红色印章痕迹。该纸莎草纸出土于阿尔西诺伊州(法尤姆地区),年代定为公元前67年。其墨迹以碳基材料为主,仅在德摩提克语文本区域的光谱成像图中检出微量铁元素。受文物保护条件限制,无法直接对印章开展分析,但通过正面XRF成像图可观测到印章痕迹,推断其含有铁元素,伴生钾与硫痕迹,推测材质为铁赭石。 配套数据与规程文件如下: PDem3_Reflectography.zip —— 完整反射成像数据集 PDem3_XRF.zip —— 完整X射线荧光光谱数据集 PDem3_XRF_Protocol.pptx —— XRF分析规程 PDem3r_Reflectography_Protocol —— 正面反射成像分析规程 PDem3v_Reflectography_Protocol —— 背面反射成像分析规程
提供机构:
Universität Hamburg
创建时间:
2024-09-05
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