Data underlying: Stacking domain morphology in epitaxial graphene on silicon carbide

This dataset contains stitched AC-LEEM overviews visualizing stacking domain boundaries in three different, high-quality graphene on SiC samples, grown in three different manners. The samples exhibit domain boundaries with different morphology, as explored in the corresponding paper. More details on the files can be found in the README.

本数据集包含拼接式交流低能电子显微镜（AC-LEEM）全景图像，用于可视化三种不同制备工艺下生长的高质量碳化硅（SiC）衬底石墨烯（graphene）样品中的堆垛畴界（stacking domain boundaries）。上述样品呈现出形貌各异的畴界，相关研究论文已对此展开深入探讨。有关本数据集文件的更多细节可参阅README文件。