Raw Data to "Overcoming barriers for high temperature alloys: oxidation and ductility"

This dataset contains the relevant raw data of the submission "Overcoming barriers for high temperature alloys: oxidation and ductility". All files highlighted by "MC" denote data on Cr-37.2Mo and "MSC" on Cr-36.1Mo-3Si (both alloy compositions given in at.%). Fig1 = Scanning electron grayscale micrographs using backscattered electron contrast as *.tif images Fig2a = area-specific mass changes (average and uncertainty in mg/cm²) as a function of oxidation time (in h); "800C" denotes 800°C and "1100C" denotes 1100°C; the dataset highlighted by "single_sample" is not averaged but determined on a single specimen Fig2b = engineering stress-strain curves (in MPa and 1, respectively) for room temperature (= "RT") and 900°C (= "900C") Fig2c = 1% offset yield strength (in MPa) as a function of testing temperature (in °C) Fig2d = true work hardening (in MPa) as a function of true stress (in MPa) for room temperature (= "RT") and 900°C (= "900C") Fig3 = Energy-dispersive X-ray spectroscopy maps as fully annotated comma-separated matrix file; the characteristic lines a highlights in the file name "CrK" = Cr-K, "MoL" = Mo-L, "SiK" = Si-K, "OK" = O-K Fig4 = Electron backscatter diffraction maps as fully annotated *.ang file FigS1 = X-ray diffraction patterns of the as cast condition as background-subtracted intensity (in 1) as a function of 2Theta diffraction angle (in °) FigS2 = X-ray diffraction patterns of the oxidized material (100 h at 800°C = "800C" and 1100°C = "1100C") as background-subtracted intensity (in 1) as a function of 2Theta diffraction angle (in °) FigS3 = Energy-dispersive X-ray spectroscopy maps as fully annotated comma-separated matrix file; the characteristic lines a highlights in the file name "CrK" = Cr-K, "MoL" = Mo-L, "OK" = O-K FigS4 = time-dependent (in h) scale thicknesses determined form scanning electron micrographs of oxide scales (in µm); "internal_corrosion_zone" denotes the thickness of the internally oxdized regions; "800C" denotes 800°C and "1100C" denotes 1100°C FigS5 = Electron backscatter diffraction maps as fully annotated *.ang file

本数据集包含投稿论文《Overcoming barriers for high temperature alloys: oxidation and ductility》的相关原始实验数据。所有以"MC"标注的文件对应Cr-37.2Mo合金，以"MSC"标注的文件对应Cr-36.1Mo-3Si合金，两种合金成分均以原子百分比（at.%）计。
Fig1：采用背散射电子衬度的扫描电子显微灰度图像，存储格式为*.tif文件。
Fig2a：比质量变化（单位：mg/cm²，包含平均值与不确定度）随氧化时间（单位：h）的变化关系；其中"800C"代表800°C，"1100C"代表1100°C；标注"single_sample"的数据集未经过平均处理，仅基于单个试样测得。
Fig2b：室温（标注为"RT"）与900°C（标注为"900C"）下的工程应力-应变曲线，应力单位为MPa，应变为无量纲量。
Fig2c：1%偏移屈服强度（单位：MPa）随测试温度（单位：°C）的变化关系。
Fig2d：室温（"RT"）与900°C（"900C"）下的真实加工硬化应力（单位：MPa）随真实应力（单位：MPa）的变化关系。
Fig3：能量色散X射线能谱（Energy-dispersive X-ray spectroscopy, EDS）mapping图，存储为带完整注释的逗号分隔矩阵文件；文件名中标记的特征谱线："CrK"对应Cr-Kα，"MoL"对应Mo-Lα，"SiK"对应Si-Kα，"OK"对应O-Kα。
Fig4：电子背散射衍射（Electron Backscatter Diffraction, EBSD）mapping图，存储为带完整注释的*.ang文件。
FigS1：铸态试样的X射线衍射（X-ray Diffraction, XRD）谱，为扣除背景后的衍射强度（无量纲）随2θ衍射角（单位：°）的变化关系。
FigS2：氧化后试样的X射线衍射谱，分别对应800°C氧化100h的"800C"试样与1100°C氧化100h的"1100C"试样，数据为扣除背景后的衍射强度（无量纲）随2θ衍射角（单位：°）的变化关系。
FigS3：能量色散X射线能谱（EDS）mapping图，存储为带完整注释的逗号分隔矩阵文件；文件名中标记的特征谱线："CrK"对应Cr-Kα，"MoL"对应Mo-Lα，"OK"对应O-Kα。
FigS4：通过氧化层扫描电子显微图像测得的氧化层厚度（单位：μm）随氧化时间（单位：h）的变化关系；其中"internal_corrosion_zone"代表内氧化区域的厚度；"800C"代表800°C，"1100C"代表1100°C。
FigS5：电子背散射衍射（EBSD）mapping图，存储为带完整注释的*.ang文件。