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Supporting information to derive the figures of the paper: "Wafer-scale low-disorder 2DEG in 28Si/SiGe without an epitaxial Si cap"

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4TU.ResearchData2022-04-13 更新2026-04-23 收录
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https://data.4tu.nl/articles/_/19181597
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The data sets provide the necessary information to derive the figures of the paper "Wafer-scale low-disorder 2DEG in 28Si/SiGe without an epitaxial Si cap" Preprint at https://arxiv.org/abs/2202.08090

本数据集提供了推导论文《无外延硅覆盖层的28Si/SiGe中晶圆级低无序二维电子气(two-dimensional electron gas,2DEG)》相关图表所需的必要信息,该论文的预印本链接为https://arxiv.org/abs/2202.08090。
创建时间:
2022-04-13
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