Collection of SEM micrographs showing FIB-fabricated Fe-2.4 wt.% Si micropillars before and after compression

SEM micrographs of Fe–2.4 wt.% Si micropillars fabricated by focused ion beam (FIB) milling and deformed by microcompression using a flat punch indenter. The dataset includes single-crystalline and bi-crystalline pillars imaged before and after testing. The micropillars with nominal diameters of 1 µm, 2 µm, and 4 µm have been imaged by TESCAN Lyra, TESCAN Mira, and TESCAN Clara microscopes. The data used in this publication was managed using the framework and metadata scheme provided by project A07 within SFB1394 Structural and Chemical Atomic Complexity — From Defect Phase Diagrams to Material Properties, project ID 409476157 funded by the Deutsche Forschungsgemeinschaft (DFG).