SEM micrographs of VO2 and V6O13 nanostructures
收藏Mendeley Data2024-01-31 更新2024-06-28 收录
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资源简介：
The DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V6O13 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under a reducing atmosphere (94% Ar, 6% H2) at 600 and 700C for 10h. The surface morphologies of the samples were studied by an FEI Company Quanta FEG 250 scanning electron microscope (SEM) (Waltham, MA, USA), mounting the analyzed sample on a carbon conductive tape. The information about the preparation of as-prepared thin film is described in the Journal of Nanomaterials.
创建时间：
2024-01-31
