PARPLE: Detailed automatized and parallel evaluation of luminescence mappings

This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2018) Abstract Laterally resolved luminescence techniques offer the possibility to examine thin film semiconductors with respect to the inhomogeneities of their opto-electronic, optical and chemical properties. Especially the integrated photoluminescence (PL) yield and splitting of quasi-Fermi levels (QFL) are of interest as well as the derived optical properties like the optical band gap, the Urbach energy and the absorption due to defect states within the band gap. For a large set of individual PL spectra... Title of program: PARPLE Catalogue Id: AEWJ_v1_0 Nature of problem Evaluation of PL spectra and extraction of opto-electronic properties including integrated PL yield, splitting of quasi-Fermi levels and optical band gap. The spectral shift of the PL spectra is covered by use of an adaptive fit procedure. Versions of this program held in the CPC repository in Mendeley Data AEWJ_v1_0; PARPLE; 10.1016/j.cpc.2015.03.017本程序源自贝尔法斯特女王大学馆藏的CPC程序库（1969年-2018年）。 摘要 侧向分辨发光技术为薄膜半导体的光电子、光学及化学性质非均匀性研究提供了可行途径。其中，积分光致发光（photoluminescence, PL）产率与准费米能级（quasi-Fermi levels, QFL）的分裂情况均具有重要研究价值，由其衍生的光学性质如光学带隙、厄巴赫（Urbach）能量以及带隙内缺陷态引发的光吸收效应亦广受关注。针对大量独立的PL光谱…… 程序名称：PARPLE 目录编号：AEWJ_v1_0 问题本质 对PL光谱进行评估并提取光电子性质，包括积分PL产率、准费米能级分裂与光学带隙。本程序通过自适应拟合流程处理PL光谱的光谱偏移问题。 本程序在Mendeley数据集中的CPC程序库版本：AEWJ_v1_0；PARPLE；10.1016/j.cpc.2015.03.017