遇见数据集

Atomic_Force_Microscopy_WP3_FORTH

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Zenodo2026-01-28 更新2026-05-26 收录
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This dataset was generated as part of DYNASTY project activities (specifically WP3, samples preparation, data production and data analysis), to support the characterization of the physical properties of van der Waals heterojunctions. Atomic Force Microscopy was carried out to evaluate the topography of MoS2 monolayers on top of dielectric nanoantennas

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Zenodo
创建时间:
2026-01-28
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