Synchrotron X-ray Diffraction Data and Evaluation Workflow for: From Mechanics to Electronics: Influence of ALD Interlayers on the Multiaxial Electro-Mechanical Behavior of Metal-Oxide Bilayers

Name: Synchrotron X-ray Diffraction Data and Evaluation Workflow for: From Mechanics to Electronics: Influence of ALD Interlayers on the Multiaxial Electro-Mechanical Behavior of Metal-Oxide Bilayers
Creator: Zenodo
Published: 2026-01-21T09:04:28+08:00

Zenodo2026-01-21 更新2026-05-26 收录

数据链接：

https://zenodo.org/doi/10.5281/zenodo.17581202 数据链接链接失效反馈

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资源简介：

Synchrotron X-ray Diffraction Data and Evaluation Workflow for the publication "From Mechanics to Electronics: Influence of ALD Interlayers on the Multiaxial Electro‐Mechanical Behavior of Metal–Oxide Bilayers" obtained at the KMC-II Beamline (DOI: 10.17815/jlsrf-2-65 ) at BESSY-II Synchrotron.

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Zenodo

创建时间：

2026-01-21