SWM for porous hierarchical nanocarbons composites
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Raw Raman spectra and XRD diffractograms (background subtracted) of 13 among which carbon-derived secondary waste and reference materials. Raman spectra were collected measured using a commercial Raman microscope (LabRam Aramis, Horiba) with excitation by a 632.8 nm HeNe laser with up to 20 mW, integration time of 5 s (20 averages); 300 lines per mm diffraction grating. XRD diffractograms were using BRUKER D2PHASER equipment with Cu Kα radiation (lambda = 1.54 Å), operating at 30 kV and 10 mA. The XRD patterns were collected using a scan step of 0.02° and a count time of 0.4 s per step. Sample ID is reported in the attached file.
创建时间：
2023-10-02
