Nanoindentation, high-angular resolution electron backscatter diffraction (HR-EBSD), and transmission electron microscopy data in synthetic forsterite bicrystal samples (NERC Grant NE/S00162X/1)

The data are nanoindentation, high-angular resolution electron backscatter diffraction (HR-EBSD), and transmission electron microscopy data collected on samples of synthetic forsterite bicrystals at room temperature. The data were collected in two samples, with high- and low- angle grain boundaries (HAGB, 60°, [100]/(011) and SB, 13°, [100]/(016)). The EBSD data are the basis for the HR-EBSD calculation. The HR-EBSD results are presented as Matlab data files. The nanoindentation data are categorised as a function of sample (‘ol13’ – low-angle grain boundary; and ‘ol60’ – high-angle grain boundary), and indenter tip geometry (spherical (with a 10 or 5 micron radius) and pyramidal (Berkovich). The data are presented in .xls files. The TEM data are presented as .tif files. The TEM data were collected in specific indents with various distances from the interfaces. These data have been published in the manuscript: : The Role of Grain Boundaries in Low-Temperature Plasticity of Olivine Revealed by Nanoindentation, with the DOI: 10.1029/2023JB026763本数据集涵盖室温下采集的合成镁橄榄石双晶样品的纳米压痕（nanoindentation）、高角分辨率电子背散射衍射（high-angular resolution electron backscatter diffraction, HR-EBSD）以及透射电子显微镜（transmission electron microscopy, TEM）测试数据。 本次实验共使用两块测试样品，分别带有高角晶界（high-angle grain boundaries, HAGB，取向关系为60°，[100]/(011)）与低角晶界（low-angle grain boundaries, SB，取向关系为13°，[100]/(016)）。 电子背散射衍射数据为高角分辨率电子背散射衍射计算的基础数据集，其结果以Matlab数据文件格式保存。 纳米压痕数据按照样品类型与压头几何参数进行分类：样品类型分为‘ol13’（对应低角晶界样品）与‘ol60’（对应高角晶界样品）；压头类型则分为球形压头（半径为10或5微米）与贝氏（Berkovich）锥形压头，相关数据以.xls格式文件存储。 透射电子显微镜数据以.tif格式文件存储，采集自距晶界不同距离的特定压痕区域。 本数据集对应的研究成果已发表于论文《The Role of Grain Boundaries in Low-Temperature Plasticity of Olivine Revealed by Nanoindentation》，中文译名为《纳米压痕揭示的橄榄石低温塑性中晶界的作用》，DOI编号为10.1029/2023JB026763。