Interpretation of the thickness of Quaternary deposits on the inner-continental shelf within the New York Bight, derived from seismic data collected by the U.S. Geological Survey, 1995 - 1999 (Grid, UTM Zone 18N, WGS84 and Esri polyline shapefile, Geographic, WGS84)
收藏USGS-Science Data Catalog2026-03-14 收录
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https://data.usgs.gov/datacatalog/data/USGS:197e2dc7-3f0a-4ccc-aca5-0e6638a3cfb2
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资源简介：
Mapping the thickness of the Quaternary sediment is useful
for delineating the geologic framework of the New York Bight
inner-continental shelf. This in turn aids in understanding
the stratigraphic evolution of the inner-continental shelf,
the regional sediment transport system, and the influence of
the inner-shelf framework on coastal processes. The grid
showing the thickness of Quaternary sediment is an important
factor in the framework of the coastal region.
创建时间：
2026-03-28
