Figure 3: Assembly formation and characterization with Helium Ion Microscopy (HIM), Atomic Force Microscopy (AFM), and Transmission Electron Microscopy (TEM)

Figure 3: Assembly formation and characterization with Helium Ion Microscopy (HIM), Atomic Force Microscopy (AFM), and Transmission Electron Microscopy (TEM), all reveal fractal-like topologies on a surface, (A to G) Longer fractal-like structures, branch-like, and flower-like structures are seen in HIM (A to C) and AFM (D). (E) Representative HIM images for assemblies obtained at different concentrations of pY-AtzAM1 (250 nM- 3 µM) while maintaining a fixed concentration of AtzCM1-SH2 (2 µM). Increasing concentrations of pY-AtzM1 result in larger assemblies with higher fractal dimensions. (F) Df and l, the fractal dimension and lacunarity of the images, are similar for images obtained from different microscopy techniques. HIM images show fractal-like assembly formation with pY-AtzAM1 and AtzCM1-SH2 (G), while the Gly-Ser-rich linker-containing variants form globular assemblies under these conditions (H).