Dataset: Quantitative Approaches for Multi-scale Structural Analysis with Atomic Resolution Electron Microscopy

Raw data for atomic-resolution imaging with scanning transmission electron microscopy, a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions. Here, we present data for image analysis approaches which synergize real and reciprocal space information to efficiently and reliably obtain meaningful structural information with picometer scale precision across hundreds of nanometers of material from atomic-resolution electron microscope images.