Atomic force microscope (AFM) images of B&Ni2+ electrocatalyst
收藏DataCite Commons2026-03-19 更新2026-05-04 收录
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资源简介：
The morphology and architecture of the borophene modified with Ni samples were analyzed using an atomic force microscope (AFM). The imaging was performed on Si wafers using a Nanoscope V Multimode 8 instrument.
提供机构：
Gdańsk University of Technology
创建时间：
2026-03-19
