准一维材料Ba6Cr2S10多晶和单晶合成及物性表征数据

数据集“2018YFA0305701-00X-Ba6Cr2S10多晶和单晶样品的物性表征”的研究对象是Ba6Cr2S10多晶和单晶样品。样品通过高压高温大体积压机生长。样品结构分析采集的X射线衍射数据来自于中科院物理所超导实验室公共平台的高分辨X射线衍射仪，X射线单晶衍射数据来自于物理所技术部分析测试中心的X射线单晶衍射仪。中子衍射和μSR数据采集于英国散列中子源。比热和磁电耦合性质在物理所M08组的综合物性测试系统上完成。电子衍射和元素分析数据采集于物理所先进材料实验室A01组的透射电子显微镜和扫描电子显微镜。数据采集地点是中国科学院物理研究所和英国散列中子源，数据采集时间从2017年1月至2019年12月。

The dataset titled "2018YFA0305701-00X-Ba6Cr2S10: Physical Property Characterization of Polycrystalline and Single-Crystal Ba6Cr2S10 Samples" takes polycrystalline and single-crystal Ba6Cr2S10 samples as its research subject. The samples were grown using a high-pressure high-temperature (HPHT) large-volume press. X-ray diffraction (XRD) data for structural analysis were collected via a high-resolution X-ray diffractometer at the Public Platform of the Superconducting Laboratory, Institute of Physics, Chinese Academy of Sciences (IOP, CAS). Single-crystal X-ray diffraction (SC-XRD) data were acquired at the Analytical Testing Center of the Technical Department, IOP, CAS. Neutron diffraction and μSR data were collected at the ISIS Neutron and Muon Source, United Kingdom. Specific heat and magnetoelectric coupling properties were measured using the Physical Property Measurement System (PPMS) of Group M08 at IOP, CAS. Electron diffraction and elemental analysis data were collected using a transmission electron microscope (TEM) and scanning electron microscope (SEM) at Group A01 of the Advanced Materials Laboratory, IOP, CAS. All data were collected at the Institute of Physics, Chinese Academy of Sciences and the ISIS Neutron and Muon Source, United Kingdom, with the data collection period spanning from January 2017 to December 2019.

搜集汇总

背景与挑战

背景概述

该数据集聚焦于准一维材料Ba6Cr2S10的多晶和单晶样品，采用高压高温方法合成。数据涵盖了X射线衍射、中子衍射、比热和磁电耦合等多种物性表征，采集于中国科学院物理研究所和英国散列中子源，时间范围为2017年至2019年。