Engineering the Temporal Dynamics of All-Optical Switching with Fast and Slow Materials

Source data for Fig 1d. Contains the tables of Time (pump probe delay) vs the measured and the normalized optical density. The time axis for different data runs have been shifted to align the maximum signals for easier data comparison. The normalized data in each graph has been shifted vertically by 0.3 with respect to the next graph to compare the decay rates. Because of different experimental configurations for the NIR and the visible wavelength probes, the pump probe delay at with the peak of each experiment occurs is slightly shifted. The time axes for the longer wavelengths (900 to 1300 nm) have been shifted by 0.6 ps to align the peaks for easier comparison. For normalization, the intensity of each modulation graph has been divided by the peak intensity (positive or negative, depending on the wavelength). Source data for Fig 2b. Contains the tables of simulated reflectance of p polarized (Rp) and s polarized (Rs) light from the device, as well as experimentally measured reflectance, versus the wavelength. Source data for Fig 2cd. Contains the tables of wavelength and permittivities of TiN and AZO films. The comments contain the film thicknesses. Source data for Fig 3b. Contains the color map of the reflectance modulation for TiN versus wavelength (nm) and pump-probe delay (ps) Source data for Fig 3c. Contains the normalized transient reflectance modulation vs time of TiN on Si at a wavelength of 505 nm. Source data for Fig 3d. Contains the color map of the reflectance modulation of AZO film vs wavelength and pump probe delay. Source data for Fig 3e. Contains the normalized transient reflectance modulation vs time of AZO at a wavelength of 1210 nm. Source data for Fig 4a. Contains the color map of the reflectance modulation of the device under a visible probe, versus the wavelength and the pump-probe delay. Source data for Fig 4b. Contains the color map of the reflectance modulation of the device under an infrared probe, versus the wavelength and the pump-probe delay. Source data for Fig 4c. Contains the absorbance of light versus the wavelength in the TiN and the AZO layers, simulated by COMSOL Multiphysics Source data for Fig 4d. Contains the normalized reflectance modulation of TiN film (505nm wavelength), AZO film (1210nm wavelength), Device (508 and 1180 nm wavelength), versus the pump probe delay. The time axes have been shifted to align the maximum reflectance modulation of the device with that of the individual films. Source data for Fig 5b. Contains the Normalized reflectance modulation of the device at various wavelengths versus the time, together with the fits from the model. All wavelengths are in nm and time is in ps, unless otherwise stated. The data processing and labeling is same as that of Fig 1d. All wavelengths are in nm and time is in ps, unless otherwise stated.

图1d的源数据：包含泵浦探测延迟（pump probe delay）与实测光密度、归一化光密度的对应数据表。为便于数据比对，已对不同实验批次的时间轴进行平移，使信号峰值对齐。为对比衰减速率，每张图表中的归一化数据均相较于下一张图表垂直偏移0.3。由于近红外（NIR）与可见光波长探针的实验配置存在差异，各实验的峰值对应泵浦探测延迟略有偏移。针对900~1300 nm的长波长数据，已将其时间轴平移0.6 ps以对齐峰值，便于比对。归一化处理时，每张调制曲线的强度均除以其峰值强度（正负由波长决定）。
图2b的源数据：包含器件的p偏振光（Rp）与s偏振光（Rs）模拟反射率、实测反射率随波长变化的数据表。
图2c、d的源数据：包含氮化钛（TiN）与掺铝氧化锌（AZO）薄膜的波长与介电常数数据表，备注中包含薄膜厚度信息。
图3b的源数据：包含氮化钛的反射率调制热图，横轴为波长（单位：nm），纵轴为泵浦探测延迟（单位：ps）。
图3c的源数据：包含硅基底上氮化钛样品在505 nm波长下的归一化瞬态反射调制随时间变化的数据。
图3d的源数据：包含AZO薄膜的反射率调制热图，横轴为波长，纵轴为泵浦探测延迟。
图3e的源数据：包含AZO样品在1210 nm波长下的归一化瞬态反射调制随时间变化的数据。
图4a的源数据：包含可见光探针下器件的反射率调制热图，横轴为波长，纵轴为泵浦探测延迟。
图4b的源数据：包含红外探针下器件的反射率调制热图，横轴为波长，纵轴为泵浦探测延迟。
图4c的源数据：包含通过COMSOL Multiphysics模拟得到的氮化钛与AZO薄膜的光吸收度随波长变化的数据。
图4d的源数据：包含氮化钛薄膜（505 nm波长）、AZO薄膜（1210 nm波长）以及器件（508 nm与1180 nm波长）的归一化反射调制随泵浦探测延迟变化的数据。为便于比对，已平移各曲线的时间轴，使器件的最大反射调制与单组分薄膜的峰值对齐。
图5b的源数据：包含不同波长下器件的归一化反射调制随时间变化的数据，以及模型拟合结果。除特别注明外，所有波长单位均为nm，时间单位均为ps。数据处理与标注方式与图1d一致。