WVM: A computer program for the determination of lattice parameters and strains in thin films

Abstract
X-ray diffraction provides a method for the determination of the strain and stress tensor in a polycrystalline sample. The knowledge of the unstrained lattice parameters is a prerequisite to calculate strains from measured reflection shifts. For thin films a model exists to find the unstrained lattice parameters and the strain or stress tensor together from the measured reflection positions.

Title of program: WVM
Catalogue Id: ADDM_v1_0

Nature of problem
Calculate the strain tensor epsilon 2<->and the strain-free lattice parameters of a thin polycrystalline film from measured X-ray reflection positions.

Versions of this program held in the CPC repository in Mendeley Data
ADDM_v1_0; WVM; 10.1016/0010-4655(96)00055-0

This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2019)