Double acceptance sampling plan based on truncated life tests for two-parameter Xgamma distribution

In this paper, a double acceptance sampling plan (DASP) in terms oftruncated life tests is oered assuming that the lifetime of a product followsthe two-parameter Xgamma (TPXG) distribution. The mean of the TPXGdistribution is considered as the quality parameter. For a certain values ofthe consumer's condence level, the minimum sample sizes of the rst andsecond samples required to assert the identied mean life are achieved. Thecorresponding operating characteristic (OC) values for to the various qualitylevels are attained as well as the minimum ratios of the mean life to theindicated life are obtained. Numerical results and examples are presentedfor illustration.