Data underlying: "Method to traceably determine the refractive index by measuring the angle of minimum deviation"
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https://zenodo.org/record/7462432
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资源简介：
Datasets of refractive index measurements of fused silica measurements at 405 nm, 436 nm, 546 nm and 579 nm, published in "Method to traceable determine the refractive index by measuring the angle of minimum deviation".
创建时间：
2023-02-14
