Dataset for manuscript \Characterization of the X-ray-induced leakage path in a linear voltage regulator\

For specified bias conditions and load current, the most significant simulation results were presented in the appropriate braking radiation environment, which was necessary for characterizing the bremsstrahlung-induced leakage path in the LM2990T voltage regulator. A test point was defined for every anticipated total ionizing dose, anticipated in krad(Si), with an ensemble of data necessary for characterization of leakage path R107. For the specified values of leakage resistances, R107 and R105, data on input and output voltages, as well as voltages of the base and emitter terminals (V(N050) and V(N057)) of Q61 transistor, were presented. Also, leakage currents passing through resistors R107 and R105 were shown in the dataset.