Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer
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https://zenodo.org/record/2566136
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资源简介：
Electron diffraction patterns taken with a conical illumination (electron Bessel beams) and can be used to measure strain.
The experimental diffraction patterns, in DM3 format, are included in the file experimental_data.7z while FEM strain simulations for the same sample are in the file reference_strain_experimental.csv
Simulated diffraction patterns are included in the file simulated_patterns.7z while the strain in the model used is in the file reference_strain_simulated_patterns.csv
The two python scripts attached allow the extraction of the strain, and rely on the code published at:
https://bitbucket.org/lutosensis/tem-thesis/
创建时间：
2020-01-24
