Data underlying the Chapter "The formation of metallic domains by Anderson-Mott insulator-to-metal transition in photochromic yttrium oxyhydride films studied by in-situ spectroscopic ellipsometry"

This dataset includes data obtained from spectroscopic ellipsometry, transmittance, and X-ray diffraction measurements under the research "The formation of metallic domains by Anderson-Mott insulator-to-metal transition in photochromic yttrium oxyhydride films studied by in-situ spectroscopic ellipsometry". Raw and processing data of measurements can be found under the file "raw data_in-situ illumination ellipsometry" and "processing data_in-situ illumination ellipsometry".

本数据集收录了某项研究中通过光谱椭偏术（spectroscopic ellipsometry）、透射率测量以及X射线衍射（X-ray diffraction）采集得到的数据，该研究主题为"利用原位光谱椭偏术（in-situ spectroscopic ellipsometry）探究光致变色羟基氧化钇薄膜（photochromic yttrium oxyhydride films）中安德森-莫特绝缘体-金属转变（Anderson-Mott insulator-to-metal transition）诱导的金属畴形成"。本次测量的原始数据与处理后数据可分别于"raw data_in-situ illumination ellipsometry"与"processing data_in-situ illumination ellipsometry"文件中获取。